Light and x-ray optics [electronic resource] : refraction, reflection, diffraction, optical devices, microscopic imaging / Emil Zolotoryabko.
- 作者： Zolotoyabko, Emil.
- 其他題名：
- De Gruyter STEM.
- 出版： Berlin ;Boston : De Gruyter c2023.
- 叢書名： De Gruyter STEM
- 主題： X-ray optics.
- 版本：1st ed.
- ISBN： 9783111140100 (electronic bk. ;PDF) 、 9783111140896 (electronic bk. ;EPUB)
- URL：
電子書(校內)
電子書(校外)
- 一般註：Includes index. Introduction -- Foundations of geometrical optics -- Fermat's principle: light reflection and refraction -- Fermat's principle: focusing of visible light and X-rays -- Refractive index in anisotropic crystals -- Polarization, birefringence, and related phenomena -- Strong frequency effects in light optics -- Interference phenomena -- Light and X-ray interferometers -- Phase-contrast microscopy -- Fraunhofer diffraction -- Beyond diffraction limit -- Fresnel diffraction -- Optics of dynamical diffraction -- Dynamical diffraction of quantum beams: basic principles -- Specific features of dynamical X-ray diffraction -- Optical phenomena in photonic structures -- List of scientists. 114年度臺灣學術電子書暨資料庫聯盟採購
- 語文註：In English.
-
讀者標籤：
- 系統號： 000325331 | 機讀編目格式
館藏資訊
Contemporary optics is the foundation of many of today’s technologies including various focusing and defocusing devices, microscopies and imaging techniques. Light and X-ray Optis for Materials Scientists and Engineers offers a guide to basic concepts and provides an accessible framework for understanding this highly application-relevant branch of science for materials scientists, physicists, chemists, biologists, and engineers trained in different disciplines. The text links the fundamentals of optics to modern applications, especially for promotion of nanotechnology and life science, such as conventional, near-field, confocal, phase-contrast microscopies and imaging schemes based on interference and diffraction phenomena. Written by a noted expert and experienced instructor, the book contains numerous worked examples throughout to help the reader gain a thorough understanding of the concepts and information presented. The text covers a wide range of relevant topics, including reflection, refraction, and focusing phenomena, wave polarization and birefringence in crystals, optics in negative materials, metamaterials, and photonic structures, holography, light and X-ray interferometry, extensive description of diffraction optics, including dynamical X-ray diffraction, and more.
摘要註
Contemporary optics is the foundation of many of today's technologies including various focusing and defocusing devices, microscopies and imaging techniques. Light and X-ray Optis for Materials Scientists and Engineers offers a guide to basic concepts and provides an accessible framework for understanding this highly application-relevant branch of science for materials scientists, physicists, chemists, biologists, and engineers trained in different disciplines. The text links the fundamentals of optics to modern applications, especially for promotion of nanotechnology and life science, such as conventional, near-field, confocal, phase-contrast microscopies and imaging schemes based on interference and diffraction phenomena. Written by a noted expert and experienced instructor, the book contains numerous worked examples throughout to help the reader gain a thorough understanding of the concepts and information presented. The text covers a wide range of relevant topics, including reflection, refraction, and focusing phenomena, wave polarization and birefringence in crystals, optics in negative materials, metamaterials, and photonic structures, holography, light and X-ray interferometry, extensive description of diffraction optics, including dynamical X-ray diffraction, and more.